Description
The Keysight B2962C is a state-of-the-art 2-channel low-noise power source and source/measure unit (SMU), engineered to deliver exceptional precision, flexibility, and performance in advanced electronic testing applications. Designed for engineers and researchers working with sensitive devices and low-level signals, it combines high-resolution sourcing with accurate measurement in a single, compact benchtop solution.
Featuring industry-leading 6.5-digit resolution with a minimum of 100 nV / 10 fA, the B2962C enables ultra-precise control and measurement of voltage and current. Its wide 4-quadrant (bipolar) operation allows both sourcing and sinking, making it ideal for characterizing a broad range of components and materials.
With extremely low noise performance (as low as 10 Vrms and 1 nV/Hz), the instrument ensures clean, stable outputs for highly sensitive measurements. Advanced capabilities such as programmable output resistance, arbitrary waveform generation, and an integrated time-domain waveform viewer provide powerful tools for in-depth analysis and troubleshooting.
The intuitive graphical user interface with a 4.3″ color display enhances usability, while remote control options via software like BenchVue and LXI-compatible interfaces allow seamless integration into automated test environments.
Key Features
- 2-channel precision SMU / power source
- 6.5-digit resolution (100 nV / 10 fA)
- Wide 4-quadrant operation (±210 V, ±3 A, up to 10.5 A pulse)
- Ultra-low noise performance (10 Vrms, 1 nV/Hz)
- Programmable output resistance
- Arbitrary waveform generation (1 mHz 10 kHz)
- Time-domain waveform viewer
- 4.3″ color LCD with intuitive GUI
- Remote control via BenchVue / LXI
Ideal Applications
- Semiconductor and device characterization
- Low-current and precision measurements
- Sensor and material testing
- Power electronics development
- Research & laboratory environments
The B2962C combines precision sourcing, ultra-low noise, and advanced analysis toolsmaking it an essential instrument for high-accuracy electronic testing and characterization.
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